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Journal Article

Improving metrology with quantum scrambling

Z. Li, S. Colombo, C. Shu, G. Velez, S. Choi, M. Lukin, E. Pedrozo-Peñafiel, V. Vuletic, S. Pilatowsky-Cameo, R. Schmied

Science, vol. 380, no. 6652, pp. 1381-1384, 6 2023.

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